Unlocking the Secrets of Battery Materials: A Dive into AFM-in-SEM Characterization Webinar

Unlocking the Secrets of Battery Materials: A Dive into AFM-in-SEM Characterization Webinar

Understanding batteries inside out: Characterizing batteries and their individual components (cathodes, electrolytes, anodes, and SEI) is indispensable for the development of advanced energy storage solutions. Explore how degradation processes transform these components during cycling and gain a profound insight into the mechanisms influencing battery lifetime and performance. We will explain and demonstrate how multiple techniques, such as SEM, EDX, and AFM, bring significant benefits for battery materials characterization.

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During the webinar, you will learn:

  • Key challenges in the characterization of batteries and their components and how AFM-in-SEM technology resolves them.
  • Efficient sample preparation workflow of extremely air-sensitive battery samples, their cross-sectioning, and sample transfer to integrated AFM/SEM/EDX instrument.
  • Application examples of in-situ correlative microscopy analysis of various cathode materials (NCM, NCA) in pristine and cycled stages. We will demonstrate how AFM-in-SEM is used to understand the degradation process inside the cathodes.

Why watch the webinar?

  • Gain insights into the critical challenges of battery materials characterization.
  • Learn how AFM-in-SEM technology can address these challenges effectively.
  • Discover efficient sample preparation techniques for air-sensitive battery materials.
  • Explore application examples of in-situ correlative microscopy.
  • Understand the role of AFM-in-SEM in deciphering cathode degradation processes.

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Who we work with

We have recently acquired the NenoVision AFM. This AFM is running inside the chamber of one of our SEMs and it enables us to do a correlative study of all materials. We can combine whatever we see in the SEM with whatever the AFM delivers. There are so many things you can do with such an AFM. It's like having a Swiss army knife inside the chamber of your SEM.

Marc-Georg Willinger
TU Munich / Professor

We have greatly appreciated every aspect of our collaboration with NenoVision. Our communication has been smooth, efficient, and informative. By utilizing their novel CPEM technology, NenoVision helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires. We truly appreciated all the assistance we received from NenoVision and hope to continue this fruitful collaboration in the future.

Wouter Metsola van der Wijngaart
Department of Micro and Nanosystems, KTH Royal Institute of Technology / Deputy head of Department

LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.

Antonín Fejfar
Institute of Physics of the Czech Academy of Sciences / Deputy director