NenoVision Webinar Series: Combining AFM with FIB-SEM

Merging LiteScope with FIB-SEM systems allows not only for evaluation and control of the FIB nanofabrication process but also enables its optimization. Researchers gain enhanced possibilities of surface characterization and control over FIB milling processes. See how to modify the sample surface and measure it immediately by AFM in in-situ conditions.