Webinar LiteScope 2.0 & Correlative microscopy AFM in SEM

At the occasion of the release of LiteScope 2.0, we organized a webinar dedicated to its principal and unique feature, correlative AFM in SEM microscopy. During the webinar guided you our CEO Jan Neuman, who presented the second generation of our LiteScope, its unique applications and also crucial benefits and advantages of the innovative technology which represents.