AI in correlative AFM-in-SEM microscopy

Recording of the webinar held on the 13th of July 2022. Learn about the perspectives of machine learning in microscopy (segmentation, noise elimination etc.) and get familiar with CPEM Plus, an AI-driven tool for automatic correlation of AFM and SEM images, and its examples. You can also see the possibilities of implementing new machine learning algorithms in NenoView, an open software developed for controlling correlative measurements