AFM-in-SEM represents a unique solution for the complex characterization of 2D material properties. Characterizing and understanding properties such as topography, mechanical, electrical, and magnetic characteristics in relation to chemical composition is fundamental for the development and practical application of functionalized 2D materials.
2D materials are vital in various industries like automotive, semiconductors, petrochemistry, and aircraft engines due to their outstanding properties. Understanding their microstructure, defects, and mechanical/electrical traits is crucial. Effective fabrication and quality control are key to maximizing their potential in advanced technologies.
Microscopy is fundamental when working with 2D materials, and the possibility of combining it with AFM opens to a new world of possibilities. Picking up a single flake and being able to measure its thickness saves up time and gives important information at the same time. AFM and SEM combination has advantages that can be exploited in research, but LiteScope has other properties that allow us to make other relevant analysis such as C-AFM, I-V curves, and many other features.
The conventional characterization of 2D materials often necessitates multiple instruments, resulting in challenging and time-consuming localization of regions of interest (ROI). LiteScope, operating within the SEM environment, offers the capability to conveniently localize specific areas, enabling repeatable and comprehensive multimodal analysis. This makes LiteScope an indispensable tool for producing and quality control 2D materials.
Key added value
- Complex in-situ characterization capabilities.
- Fast and precise localization of specific flakes.
- Tailored in-situ characterization workflow.
LiteScope: AFM-in-SEM valuable solution for 2D materials analysis
Comprehensive in-software analysis provided by NenoView now includes a three-point plane fit, ideal for samples with step-like structures. This addition expands NV's capabilities, enabling more thorough in-software analysis of 2D materials.
Streamlined data management. Dealing with complex sample characterizations often results in numerous measurement files with different outputs. Our new feature allows users to effortlessly merge all desired results into a single file directly within NV. This simplifies data handling and empowers advanced correlative methods, making analysis faster and more convenient.
Specially designed probes and probe holders now enable the performance of various measurement modes with a single probe. Users can conduct electrical, mechanical, and piezoelectrical measurements without the need of probe changing, allowing fast multimodal analysis.
The integration of LS inside SEM, combined with the multimodal capabilities of our probes, allows users to perform all measurements under the same controlled conditions. This in-situ approach simplifies the analytical process and ensures consistent, reliable results across different modalities.
Enabling characterization of 2D materials monolayer.
Enabling to analyze large 2D materials flakes in one measurement.