Graphene on silicone carbide (SiC)

Graphene prepared by thermal decomposition of SiC is formed mainly at the edges of SiC terraces. Graphene growth is very sensitive to the temperature during the etching process, and the final quality of the layer may differ across the sample. The AFM-in-SEM approach allows for fast and effective quality analysis of the sample.

LiteScope benefits:

  • Fast identification of the area of interest in the sample.
  • Combination of the SEM material contrast with AFM topographical assessment and monolayer resolution.
  • All in one measurement.
Published with courtesy: Jan Kunc, MFF UK, Czechia

Graphene on Cu foil

In this application, graphene serves as a protective layer of the surface. The copper foil under the graphene is protected against oxidation, and its surface structures are preserved, unlike the surrounding of the graphene flake.

LiteScope benefits:

  • The AFM-in-SEM approach enables fast and accurate localization of a single graphene flake on the sample, and its thorough characterization: CPEM can accommodate multiple channels from both AFM (e.g. topography) and SEM (e.g. secondary electrons and back scattered electrons).

WSe2 flakes on Si nanopillars

WSe2 monolayer represents a transparent photovoltaic material with LED properties. It is an ideal material for devices with tunable bandgaps - meaning the LEDs can be made from a single material. The certain shape of the monolayer over nanopillars forms a single photon emitter.

LiteScope benefits:

  • Precise and fast nanostructure localization.
  • SEM contrast and AFM topography enable easy data interpretation with monolayer resolution.
Published with courtesy: Veronika Hegrová, NenoVision, Czechia and Martin Konecny, CEITEC BUT, Czechia

Graphene on platinum

The progress in the synthesis of high-quality and large-scale graphene is praiseworthy, however, the structural controllability and membrane homogeneity are big puzzles that researchers are faced with. CPEM technology, combining strengths of AFM and SEM, represents the perfect tool for in-situ analysis and optimization of graphene growth.

LiteScope benefits:

  • Fast and accurate localization and characterization of graphene crystals and their small surface nuances.
  • CPEM view highlights the uneven surface of platinum covered by graphene as well as the material contrast between both materials.
  • It quickly answers questions about the flake‘s shape and reveals the presence of two graphene crystals attached close to each other.
Published with courtesy: Guido Janssen, TU Delft, Netherlands