Jan Neuman to present at ISTFA 2023
CEO Jan Neuman to Present on "In-situ Correlative AFM-SEM Characterization for Failure Analysis" at upcoming ISTFA 2023
Jan Neuman, NenoVision CEO, is set to make a significant impact at the 49th International Symposium for Testing and Failure Analysis (ISTFA) 2023. He will join forces with Prof. Umberto Celano from Arizona State University to present on "In-situ Correlative AFM-SEM Characterization for Failure Analysis." The eagerly anticipated talk is scheduled for November 12, 2023, at 11:20 MST.
Jan's presentation aims to tackle these challenges, offering insights that will drive progress in microelectronics failure analysis and advance the development of energy-efficient power electronics. Stay tuned for more updates on this event.
ISTFA 2023 is dedicated to the critical challenge of increasing energy efficiency to save global resources. The event will focus on the development of efficient and reliable power electronics devices, particularly those based on silicon carbide (SiC) and gallium nitride (GaN) technologies. These technologies offer smaller sizes, lower costs, and higher efficiency in power electronics but face reliability challenges.
If you would like to meet with Jan at ISTFA 2023 do not hesitate to contact him via LinkedIn or meet him together with our distributor Angstrom Scientific, Inc., at booth number 508.