Microscopy & Microanalysis 2024 Conference

NenoVision is excited to announce participation in the Microscopy & Microanalysis 2024 Conference, from July 28 to August 1, Cleveland, Ohio in the Huntington Convention Center. Visit us at Booth 428 to explore our advanced AFM-in-SEM LiteScope microscopy solutions and meet our team. You also have an option to join us for demo and see our unique tool LiteScope in action. To secure your place, register below.

Register for LiteScope Demo

Join us for an insightful presentation by Veronika Hegrová, Head of Applications at NenoVision, on "Innovative In-Situ AFM-in-SEM Characterization Workflow of Cathode Components". Learn about the latest advancements in integrating AFM and SEM for comprehensive material analysis.  Veronika will discuss a unique measurement workflow that prevents oxidation during sample preparation, allowing detailed study of Cathode Active Materials (CAM). This workflow includes preparing CAM tape samples in a glovebox, polishing with a Broad Ion Beam (BIB), and analyzing electrical and chemical properties using AFM-in-SEM LiteScope. Discover how this controlled transfer system keeps samples free from air and humidity exposure, preserving their surfaces for accurate analysis.

Presentation Details:

Speaker: Veronika Hegrová

Title: Innovative In-Situ AFM-in-SEM Characterization Workflow of Cathode Components

Date: July 30, 2024

Time: 2:00 PM

For more information about the conference, please visit mmconference.microscopy.org. Stay connected with us on LinkedIn for updates and highlights from the event.

We look forward to seeing you in Cleveland!