European Microscopy Congress 2024

We're excited to showcase our AFM-in-SEM LiteScope and its solutions at the European Microscopy Congress 2024, happening at Copenhagen, Denmark, from August 25 to August 30, 2024. EMC is one of the most prestigious events in the microscopy community, gathering scientists, researchers, and industry experts from around the world to share advancements in microscopy and imaging technologies.

Visit us at booth A16 and learn more about applications within materials science, semiconductors, life science and nanostructure. 

Join us for an insightful presentation by Veronika Hegrová, Head of Applications or at poster session with Jan Neuman, CEO and Co-Founder at NenoVision. Learn about the latest advancements in integrating AFM and SEM for comprehensive material analysis.  Veronika will discuss a unique measurement workflow that prevents oxidation during sample preparation, allowing detailed study of Cathode Active Materials (CAM). This workflow includes preparing CAM tape samples in a glovebox, polishing with a Broad Ion Beam (BIB), and analyzing electrical and chemical properties using AFM-in-SEM LiteScope. Discover how this controlled transfer system keeps samples free from air and humidity exposure, preserving their surfaces for accurate analysis.

Presentation Details:

Speaker: Veronika Hegrová

Title: Unique in-situ characterization workflow of Cathode Components using AFM-in-SEM

Date: August 27, 2024

Time: 12:00 

Place: Plenary room

Poster Session Details:

Presenting Author: Jan Neuman

Title: In-situ electrical characterization of MOSFET transistors using AFM-in-SEM solution

Date: August 28 - 29, 2024

Time: 16:00 - 18:30

For more information about the conference, please visit https://emc2024.eu/. Stay connected with us on LinkedIn for updates and highlights from the event.

We look forward to seeing you in Copenhagen!