Register for our summer webinar on AI in correlative microscopy

Through the webinar will guide you Jan Neuman, CEO & Co-founder of NenoVision, and Jiří Materna, Machine Learning Speciallist, Lecturer & Founder od the Machine Learning College.

Participants of the webinar will:

Learn about the perspectives of machine learning in microscopy (segmentation, noise elimination etc.)

Get familiar with CPEM Plus, an AI-driven tool for automatic correlation of AFM and SEM images, and its examples

See the possibilities of implementing new machine learning algorithms in NenoView, an open software developed for controlling correlative measurements

We will be looking forward to seeing you on Wednesday, 13th of July!