Scanning Probe Microscopy controller with advanced sampling support

Scanning Probe Microscopy controller with advanced sampling support

In this new article, our colleagues together with members of the Czech Metrology Institute describe the Digital Signal Processor in detail.

Introducing a new Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements. Based on the Red Pitaya board and custom electronic boards, it offers high bit depth AD and DA converters revolutionizing the measurement capabilities. Comprehensive data collection and statistical calculations enable versatile scan paths and informed decision-making. Unlock new possibilities in Scanning Probe Microscopy with this groundbreaking DSP unit.


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