The season of big electron microscopy conferences has begun! This week you can join us at two of them, E-MRS Spring and EIPBN, both held online.
First, you can see us in E-MRS (European Material Research Society) Spring conference poster session on Wednesday, 2nd of June, at 14:30 UCT (16:30 CEST), when our Head Application Specialist Veronika Hegrová will present our poster about the novel approach to correlative microscopy and advanced surface characterization using AFM-in-SEM system.
One day later, on Thursday, 3rd of June, at 16:00 UTC (18:00 CEST), you can attend our oral presentation on the 64th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), this time the topic of NenoVision's presentation will be "AFM-in-SEM: The Novel Approach to Multimodal, Correlative Microscopy Using CPEM Technology".
You are cordially welcome to attend both conferences!