Register for our summer webinar on AI in correlative microscopy

On the 13th of July, we are coming with another part of our webinar series. This time the topic will be the use of Artificial Intelligence in microscopy. Registrations via the button below!

CPEM Plus webinar 4x3

Throught the webinar will guide you Jan Neuman, CEO & Co-founder of NenoVision, and Jiří Materna, Machine Learning Speciallist, Lecturer & Founder od the Machine Learning College.


Participants of the webinar will:

  • Learn about the perspectives of machine learning in microscopy (segmentation, noise elimination etc.)
  • Get familiar with CPEM Plus, an AI-driven tool for automatic correlation of AFM and SEM images, and its examples
  • See the possibilities of implementing new machine learning algorithms in NenoView, an open software developed for controlling correlative measurements


We will be looking forward to seeing you on Wednesday, 13th of July!