We are preparing a new webinar, this time in cooperation with our dear partners from Alemnis. It will take place on the 20th of May at 14:00 UTC, i.e. 16:00 CEST, via Micrososft Teams. Register clicking the link bellow!
During the webinar you will find our more about complex image acquisition by our unique AFM for SEM LiteScope™, and the possibilities of its extension with a nanoindentation module.
This world's unique solution enables undertaking in-situ correlative measurements by three different devices at the same time. During the webinar, our application engineer Veronika Hegrová will guide you through the process of installation and measurement with the three correlated techniques. Then our dear colleague from Alemnis company Nicholas Randall will talk more broadly about advantages of this type of measurements and consequent data evaluation.
Also we invite you to watch our past webinar about the benefits and features of LiteScope and video of nanoindentation via Alemnis' standard assembly (both embedded).
The expected duration is about 45 minutes. We will be looking forward to seeing you!