Sample rotation module for LiteScope released

We are glad to announce to you that we have enhanced the possibilities of LiteScope once again. The new sample rotation module enables you to broaden the perspective of your measurements. Literally.

Sample rotation

The sample rotation option for LiteScope deals with some of the past limitations that were present in the AFM-in-SEM solution:

  • enables measurement of several samples at the same time, without opening the SEM chamber and losing the vacuum
  • offers a considerably larger sample area for samples of unusual size
  • allows appropriate sample orientation for FIB milling and immediate AFM analysis

For researchers who need to analyse atypically shaped samples (mineralogy, cross-section analysis…), perform FIB optimisation or FIB lamellae preparation combined with AFM analysis, or other possible applications, we happily present our solution.