The LiteScope™ is of great interest to the participants of the international fair "NANOCON 2017"

Tomorrow we have the opportunity to visit our lecture Jan Neuma, Ph.D. He will talk about the principle of measurement and use examples.

Take the invitation to the lecture:

10:30 - 10:45 CONFERENCE HALL BETA (A40)

NEUMAN Jan, Ph.D. (NenoVision s.r.o., Brno, Czech Republic, EU) - LiteScope – AFM Extension for SEM as a Tool for Nanoscience and Unique Correlative Probe and Electron Microscopy (CPEM) Technique 

For details about the conference please refer to www.nanocon.eu