Current measurement results on the FEG SEM Zeiss Ultra Plus microscope in Brno at the Institute of Materials Sciences and Engineering.
Another major global event where you can become further acquainted with LiteScope™ is the international conference in Warszawa, Poland, from 10 to 13 September 2017
LiteScope ™ is also part of Schaefer's new products for Scanning Electron Microscopy (SEM) .
NenoVision has signed a partnership with Schaefer, a major player in the field of innovative scientific and engineering solutions.
Another major global event where you can become further acquainted with LiteScope™ is the international conference in Lausanne, Switzerland, from 21 to 25 August.
Nenovison will present new measurement techniques for the true correlative imaging which enable direct comparison of the images from SEM and SPM. In the second half participants will have a chance to see LiteScope directly operated in the CEITEC Nano facilities. New possibilities of the correlative microscopy by CPEM will be introduced on June 27, 2017 in CEITEC BUT at 10:00. For more information see CEITEC.
Following 11 highly successful D-A-CH FIB workshops, the 1st EUFN Workshop will be held from July 4-5, 2017 in Graz, Austria and NenoVision cannot miss it. We will present technical and application news of the LiteScope. Use the opportunity to meet us and get more information about LiteScope, the CPEM technology and how you can use it in your research.
During May 14-17, 2017 the NenoVision company will be present at one of the greatest world conferences dedicated to innovations. Meet us at stand 318 at the largest expo built specifically for the global innovation community and discuss what we can bring to your projects.
More information can be found at www.technoconnectworld.com.