GaAs nanowires have been explored for a myriad of possible devices including, transistors, photo-detectors, LED, solar cells, and nanolaser devices. The optimization of the GaAs nanowires synthesis is crucial to obtain the expected characterizations. Efficient quality control and complex analysis of the nanowires is facilitated by the AFM-in-SEM correlative microscopy.
Published with courtesy: David Fuster, Andrés Raya, Álvaro San Paulo and María Ujue González, CNM, CSIC Madrid, Spain
Graphene has the potential to create next-generation electronics - faster transistors, semiconductors, and other electronics. Graphene is also used for Surface Enhanced Raman Spectroscopy (SERS), boosting the Raman signal for ultrasensitive analytical applications.
The graphene-veiled gold nanoparticles is a candidate for this application. Analysis of such a sample is difficult by separate SEM and AFM techniques. SEM provides contrast only on Au nanoparticles, while AFM can easily visualize graphene coating, but generally struggles to image small spherical objects.
Published with courtesy: Martin Konecny, CEITEC BUT, Czechia