Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
Scanning electron microscopy (SEM) and atomic force microscopy (AFM) are the two most used techniques for sample analysis at the nanoscale. The combination of complementary AFM in SEM enhances the capabilities of both techniques. It allows you to get precise in-time image correlation without limiting the imaging options of either system.
It opens up completely new possibilities for:
AFM-in-SEM measurement is time-efficient, precise and it provides complex sample analysis while preventing sensitive samples from surface contamination and oxidation.