LiteScope™
Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
AFM in SEM - Next level of imaging
Key added values
Complex sample analysis
Unique technology of multidimensional correlative imaging enables simultaneous acquisition of data from SEM and AFM, and their seamless correlation into 3D images.
In-situ conditions
All measurements are done at the same time, in the same place and under the same conditions, preventing the need of sample transfer and risk of contamination during analyses.
Precise localization of the region of interest
Extremly precise and time saving approach using SEM to localize and navigate the AFM to the region of interest.
Key benefits
Enhancement of SEM capabilities
AFM in SEM enhances the capabilities of both techniques, enabling complex sample analysis of electrical, mechanical and magnetic properties inside SEM.
Ultimate precision of correlative imaging
Unique Correlative Probe and Electron Microscopy (CPEM) technology enables simultaneous acquisition and correlation of the chosen SEM and AFM channels.
Fast & easy localization of region of interest
SEM helps to quickly localize the region of interest and to precisely navigate the AFM tip.
In-situ analysis - no risk of sample contamination
In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.
Extension of 2D SEM image into 3D
SEM material contrast is enhanced by the information about sub-nanometer 3D topography and roughness.
Company address
NenoVision s.r.o.
Purkyňova 649/127
612 00 Brno
Czech Republic
VAT: CZ04525671
